Yang, Jinfeng and Yoshida, Yoichi (2019) Relativistic Ultrafast Electron Microscopy: Single-Shot Diffraction Imaging with Femtosecond Electron Pulses. Advances in Condensed Matter Physics, 2019. pp. 1-6. ISSN 1687-8108
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Abstract
We report on a single-shot diffraction imaging methodology using relativistic femtosecond electron pulses generated by a radio-frequency acceleration-based photoemission gun. The electron pulses exhibit excellent characteristics, including a root-mean-square (rms) illumination convergence of 31 ± 2 μrad, a spatial coherence length of 5.6 ± 0.4 nm, and a pulse duration of approximately 100 fs with (6.3 ± 0.6) × 106 electrons per pulse at 3.1 MeV energy. These pulses facilitate high-quality diffraction images of gold single crystals with a single shot. The rms spot width of the diffracted beams was obtained as 0.018 ± 0.001 Å−1, indicating excellent spatial resolution.
Item Type: | Article |
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Subjects: | Science Repository > Physics and Astronomy |
Depositing User: | Managing Editor |
Date Deposited: | 08 Mar 2023 07:17 |
Last Modified: | 22 May 2024 08:01 |
URI: | http://research.manuscritpub.com/id/eprint/576 |